Ferromagnetism above room temperature has been observed in Mn/Si3N4 multilayered films for the first time. Characterization of the structural and electronic properties was performed to study the ferromagnetic behavior of this system. X-ray absorption spectroscopy at the Mn K and L edges, as well as x-ray magnetic circular dichroism, evidences the presence of divalent Mn in the films. X-ray absorption near edge structure measurements, which are compared to calculations, confirms the presence of a slightly distorted Mn3N2 phase that is proposed to be the origin of the ferromagnetism in this system.