{"id":4634,"date":"2024-09-06T09:22:39","date_gmt":"2024-09-06T09:22:39","guid":{"rendered":"https:\/\/wp.icmm.csic.es\/esisna\/?page_id=4634"},"modified":"2024-09-06T10:01:45","modified_gmt":"2024-09-06T10:01:45","slug":"afm-lab","status":"publish","type":"page","link":"https:\/\/wp.icmm.csic.es\/esisna\/afm-lab\/","title":{"rendered":"AFM Lab"},"content":{"rendered":"<p><strong>Nanoscope IIIA (Veeco)<\/strong><br \/>\nMeasurements in air &amp; under buffer conditions<br \/>\nContact and dynamic modes<br \/>\nMagnetic Force Microscopy<br \/>\nForce curves<\/p>\n<p><strong><img loading=\"lazy\" decoding=\"async\" class=\" wp-image-4636 alignright\" src=\"https:\/\/wp.icmm.csic.es\/esisna\/wp-content\/uploads\/sites\/26\/2024\/09\/afm-225x300.png\" alt=\"\" width=\"328\" height=\"437\" srcset=\"https:\/\/wp.icmm.csic.es\/esisna\/wp-content\/uploads\/sites\/26\/2024\/09\/afm-225x300.png 225w, https:\/\/wp.icmm.csic.es\/esisna\/wp-content\/uploads\/sites\/26\/2024\/09\/afm-113x150.png 113w, https:\/\/wp.icmm.csic.es\/esisna\/wp-content\/uploads\/sites\/26\/2024\/09\/afm.png 631w\" sizes=\"auto, (max-width: 328px) 100vw, 328px\" \/>Agilent 5500 PicoPlus (Agilent)<\/strong><br \/>\nMeasurements in air &amp; under buffer conditions<br \/>\nMeasurements under controlled humidity<br \/>\nContact and dynamic modes<br \/>\nKelvin Force Microscopy<br \/>\nMagnetic Force Microscopy<br \/>\nClosed Loop piezo operation<br \/>\nForce curves while in dynamic mode<\/p>\n<p><strong>Nanobserver (CSInstruments)<\/strong><br \/>\nMeasurements in air &amp; under buffer conditions<br \/>\nContact and dynamic modes<br \/>\nMagnetic Force Microscopy<br \/>\nKelvin Force Microscopy<br \/>\nConductivity measurements: I-V curves<br \/>\nResistance maps over 10 orders of magnitude (with Resiscope Module)<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Nanoscope IIIA (Veeco) Measurements in air &amp; under buffer conditions Contact and dynamic modes Magnetic Force Microscopy Force curves Agilent 5500 PicoPlus (Agilent) Measurements in air &amp; under buffer conditions Measurements under controlled humidity Contact and dynamic modes Kelvin Force Microscopy Magnetic Force Microscopy Closed Loop piezo operation Force curves\u2026<\/p>\n<p> <a class=\"continue-reading-link\" href=\"https:\/\/wp.icmm.csic.es\/esisna\/afm-lab\/\"><span>Continue reading<\/span><i class=\"crycon-right-dir\"><\/i><\/a> <\/p>\n","protected":false},"author":50,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"ngg_post_thumbnail":0,"footnotes":""},"class_list":["post-4634","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/pages\/4634","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/users\/50"}],"replies":[{"embeddable":true,"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/comments?post=4634"}],"version-history":[{"count":4,"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/pages\/4634\/revisions"}],"predecessor-version":[{"id":4705,"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/pages\/4634\/revisions\/4705"}],"wp:attachment":[{"href":"https:\/\/wp.icmm.csic.es\/esisna\/wp-json\/wp\/v2\/media?parent=4634"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}