{"id":352,"date":"2013-05-08T10:10:11","date_gmt":"2013-05-08T12:10:11","guid":{"rendered":"http:\/\/www.icmm.csic.es\/surfcoat\/?page_id=352"},"modified":"2013-05-08T10:10:11","modified_gmt":"2013-05-08T12:10:11","slug":"characterization","status":"publish","type":"page","link":"https:\/\/wp.icmm.csic.es\/surfcoat\/equipment\/characterization\/","title":{"rendered":"Characterisation Techniques"},"content":{"rendered":"

<\/h1>\n

Equipment: Characterization Techniques<\/h1>\n\n\n\n\n\n\n\n\n\n
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Optical characterisation<\/strong><\/h2>\n<\/td>\n<\/tr>\n

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  • UV-VIS-NIR:\u00a0<\/strong>Spectrophotometer UV- 3600 Shimadzu, 190-3300 nm (resolution 0.1 nm) double beam with 3 detectors: 1 PMT for UV-VIS range and \u00a02 Solid State Detectors (InGaAs y PbS) for NIR . Integrated sphere for total and difuse R-T measurements.<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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  • IR:<\/strong> Double beam spectrophotometer HITACHI 270-50, 250-4000 cm<\/span>-1<\/sup> . Resolution 1.5 cm<\/span>-1<\/sup>\/1000 cm<\/span>-1<\/sup> and 2.5 cm<\/span>-1<\/sup>\/1000 cm<\/span>-1<\/sup><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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  • Fourier Transform Infrared (FTIR 1): <\/strong>Varian 660 FT-IR for NIR (11000-3000 cm<\/span>-1<\/sup>) and MIR \u00a0(4000-400 cm-<\/span>1<\/sup>) measurements. \u00a0DTGS and PbS detectors ,KBr and \u00a0quartz beamsplitters.<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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  • Fourier Transform Infrared (FTIR 2):<\/strong><\/strong> ABB – MB 3000. Measures in the mid-IR (500-4000 cm-1<\/sup>) with a resolution of up to 1 cm-1<\/sup> with a single beam. Measurement Modes;\u00a0Transmission and ATR (Attenuated Total Reflectance) and Specular Reflectance measurements\u00a0through an\u00a0ATR MIRacleTM<\/sup>\u00a0module from PIKE TECHNOLOGIES.<\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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  • Direct lecture Emissometer: <\/strong>Emissometer with Scaling Digital Voltmeter Model AE1 RD1 (Devices and Services Company) for emittance measurement of total hemispherical emittance at\u00a0 65o<\/sup>C (\u00b1 0.01 emittance units)<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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  • Portable Raman Espectrometer : <\/strong>Excitation wavelenght: 532 nm (<50 mW), Spectral range: \u00a065-3000 cm<\/span>-1<\/sup>, Resolution: 3.5 cm<\/span>-1<\/sup>(COMPLETAR POR ROBERTO)<\/strong><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n\n
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Mechanical and tribological characterisation<\/strong><\/strong><\/h2>\n<\/td>\n<\/tr>\n

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  • Nanoindenter:<\/strong> MicroMaterials\u00a0NanoTest Platform. Mechanical properties of thin films and coatings; Hardness, Modulus and Creep.\u00a0Load resolution: 1 micronewton. Max Load: 500mN.<\/li>\n<\/ul>\n<\/td>\n
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\u00a0\"\"<\/a><\/strong><\/p>\n<\/td>\n<\/tr>\n

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  • Pin-on disk (friction and wear tests): (Nacho J\/Nacho C\/Jose)<\/strong><\/strong><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n\n\n
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Morphological, surface, and compositional characterisation<\/strong><\/strong><\/strong><\/h2>\n<\/td>\n<\/tr>\n

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  • Perfilometry: \u00a0<\/strong><\/strong><\/strong><\/strong>VEECO DEKTAK 150 Surface Profiler with 3-D Mapping and Automation Packages included.\u00a0Sample Viewing: Color Camera and Optical Assembly with Sample Illumination.<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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    \n
  • Contact angle and surface energy setup: (Nacho J\/Nacho C\/Jose)<\/strong><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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    \n
  • Glow Discharge Optical Emission Spectroscopy (GDOES): <\/strong>Jobin Yvon RF GD Profiler equipped with a 4 mm anode, operating in continous or pulsed mode. High erosion rate (> \u00a01 \u00b5m min<\/span>-1<\/sup>) to obtain fast and reliable depth profiles. \u00a037 elements detected (see \u00a0Table)<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n\n
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Electrical characterisation<\/strong><\/strong><\/strong><\/h2>\n<\/td>\n<\/tr>\n

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  • Four-probe resistivity setup :<\/strong>Resistivity measurement by four-point probe method (Jandel Model RM2 model). The test unit consists in a constant current source and a digital voltmeter, measuring in the range 199.99mV-1999.9 mV with an input impedance of 1000 m\u03a9<\/span><\/li>\n<\/ul>\n<\/td>\n
\u00a0\"\"<\/a><\/td>\n<\/tr>\n
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Others<\/strong><\/h2>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/td>\n

<\/td>\n<\/tr>\n
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  • <\/strong><\/strong>Stereomicroscope LEICA MZ12:<\/strong>\u00a0Zoom 12.5:1 with interchangeable objectives.\u00a0Objectives: : LEICA PLAN APO 1.0x.<\/span>\u00a0Eyepieces: 10x\/21B and 25x\/9.5B.<\/span>\u00a0Zoom Factor:0.8-10X.<\/span>\u00a0Cold light source LEICA CLS 100X.<\/span>\u00a0Video module LEICA IC A.<\/span><\/li>\n<\/ul>\n<\/td>\n
<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Equipment: Characterization Techniques Optical characterisation UV-VIS-NIR:\u00a0Spectrophotometer UV- 3600 Shimadzu, 190-3300 nm (resolution 0.1 nm) double beam with 3 detectors: 1 PMT for UV-VIS range and \u00a02 Solid State Detectors (InGaAs y PbS) for NIR . Integrated sphere for total and difuse R-T measurements. \u00a0 IR: Double beam spectrophotometer HITACHI 270-50,…<\/p>\n

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