The potential of High-Speed AFM for high resolution imaging of processes was anticipated about 20 years ago. In the last 10 years, conceptual and instrumentation advances have converted HS-AFM in one of the hot topics of nanoscale characterization. The session focused on HS-AFM will present the latest and more exciting results obtained by the pioneers and leading scientists of the field.

Invited Speakers

Toshio Ando

Expert Speakers

Georg Fantner
Noriyuki Kodera
Simon Scheuring
Jim De Yoreo