Nanoscope IIIA (Veeco)
Measurements in air & under buffer conditions
Contact and dynamic modes
Magnetic Force Microscopy
Force curves
Agilent 5500 PicoPlus (Agilent)
Measurements in air & under buffer conditions
Measurements under controlled humidity
Contact and dynamic modes
Kelvin Force Microscopy
Magnetic Force Microscopy
Closed Loop piezo operation
Force curves while in dynamic mode
Nanobserver (CSInstruments)
Measurements in air & under buffer conditions
Contact and dynamic modes
Magnetic Force Microscopy
Kelvin Force Microscopy
Conductivity measurements: I-V curves
Resistance maps over 10 orders of magnitude (with Resiscope Module)