Marta Tello Ruiz


Research experience:

  • Local oxidation nanolithography with Atomic Force Microscopy.
  • January 2005 – April 2007: Posdoctoral stay at Cambridge University, UK in the group of Prof. Henning Sirringhaus.

    • Kelvin Probe characterization of organic transistors.
  • May 2007 – June 2008: Postdoctoral stay at iNANO, Denmark in the group of Prof. Flemming Besenbacher.

    • AFM characterization of inorganic clays to be used in modified cements.
    • Characterization of bacteria in liquid media by Atomic Force Microscopy.
  • March 2009 – July 2011: Juan de la Cierva postdoctoral researcher at the Instituto de Microelectrónica de Madrid, CSICin the group of Prof. Ricardo García.

    • Force spectroscopy on 3D-extracellular matrices by Atomic Force Microscopy.
    • Fabrication of Si nanowire Field Effect Transistors by different techniques (AFM, SEM, optical lithography) to be used as optical sensors.
  • July 2011 – June 2013: JAE-Doc postdoctoral researcher at the Instituto de Ciencias de Materiales de Madrid, CSIC at ESISNA group.

    • Scanning tunneling microscopy studies on biomolecules

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