NANOPARTICLE FABRICATION

Ultra High Vacuum (UHV) chamber with sample heating capacity

Ion Cluster Source (ICS)

With a 2 inch magnetron

Multiple Ion Cluster Source (MICS)

With 3 independent 1 inch magnetrons

SURFACE CHARACTERIZATION

Spectroscopies  

X-ray Photoemission (XPS) & Auger Spectroscopy (AES)                                                    

SPECS Phoibos 100 spectrometer

Ultra High Vacuum conditions

Dual Al, Mg anode

Electron source

Ion bombardment facility

Sample heating facility

                                                                                                                          

   Magnetoelastic Coupling Evidence by Anisotropic Crossed Thermal Expansion in Magnetocaloric RSrCoFeO6 (R = Sm, Eu) Double Perovskites

Atomic Force Microscopy (AFM)

From Nanotec electrónica S.L.

Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip.

Tensiometer

Theta flex. Biolin Scientific.