(contact person: Dr. Ricardo Jiménez riqjim@icmm.csic.es)

DIELECTRIC CHARACTERIZATION

-Sample holders for bulk ceramics and thin films

-Measurement on small top electrodes with micromanipulators (1 mm) available

 

High temperature measurement set-up:

Temperature range: room temperature – 900 K

Atmosphere: Vacuum or any gas flux or static atm. (O2, N2, Ar)

Cryostate set-up:

Temperature range: 100 K – 500 K

Atmosphere: Vacuum or any inert gas flux (N2, Ar). O2 available only for low temperatures

 

FERROELECTRIC CHARACTERIZATION

Home built system

 

 

 

 

 

Commercial RT66A ferroelectric test system

 

 

 

PIEZOELECTRIC CHARACTERIZATION

Berlincourt

Resonance method

PYROELECTRIC CHARACTERIZATION