(contact person: Dr. Ricardo Jiménez riqjim@icmm.csic.es)
DIELECTRIC CHARACTERIZATION
-Sample holders for bulk ceramics and thin films
-Measurement on small top electrodes with micromanipulators (1 mm) available
High temperature measurement set-up:
Temperature range: room temperature – 900 K
Atmosphere: Vacuum or any gas flux or static atm. (O2, N2, Ar)
Cryostate set-up:
Temperature range: 100 K – 500 K
Atmosphere: Vacuum or any inert gas flux (N2, Ar). O2 available only for low temperatures
FERROELECTRIC CHARACTERIZATION
Home built system
Commercial RT66A ferroelectric test system
PIEZOELECTRIC CHARACTERIZATION
Berlincourt
Resonance method