functional properties characterization Lab

(contact person: Dr. Ricardo Jiménez riqjim@icmm.csic.es)

DIELECTRIC CHARACTERIZATION

dielectric measurements

-Sample holders for bulk ceramics and thin films

-Measurement on small top electrodes with micromanipulators (1 mm) available

 

measurement cell films_2High temperature measurement set-up:

Temperature range: room temperature – 900 K

Atmosphere: Vacuum or any gas flux or static atm. (O2, N2, Ar)

Cryostate set-up:

Temperature range: 100 K – 500 K

Atmosphere: Vacuum or any inert gas flux (N2, Ar). O2 available only for low temperatures

 

FERROELECTRIC CHARACTERIZATION

Home built system

hysteresis loops diagram-1

 

 

 

 

 

Commercial RT66A ferroelectric test system

 

 

 

PIEZOELECTRIC CHARACTERIZATION

Berlincourt

Berlincourt

Resonance method

PYROELECTRIC CHARACTERIZATION