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Dr. Jesús Ricote

CSIC Tenured Scientist

j.ricote@csic.es @jricote_science

• Current research projects:

PID2019-104732RB-I00 (Spanish National Research Agency)

• Scientific production:     Resultado de imagen de research id  Researcher ID

        Scopus 

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• Director of CSIC Postgraduate course: Fronteras en Ciencia de Materiales
• Member of the Management Committee of the Spanish platform 
• Member of the Ferroelectrics Technical Standing Committee of the IEEE-UFCC Society
 
 
 
 

 

Education

  • 1990 Degree in Physics (Universidad Complutense de Madrid)
  • 1994 PhD in Physics (Universidad Complutense de Madrid )

Research Experience

Management Responsabilities

  • 2009-2012 Vicedirector Instituto de Ciencia de Materiales de Madrid
  • March-July 2012 Scientific Advisor. CSIC Vicepresidency for International Affairs
  • July 2012-August 2014 CSIC deputy Vice President for Internationalization

Research Interests

  • Study of local functional properties

Scanning Force Microscopy of piezoelectric materials (Piezoresponse Force Microscopy)

Local piezoelectric properties in polycrystalline materials

Local magnetoelectricity at interfaces

  • Functional thin films

Low temperature deposition of crystalline oxide thin films on flexible substrates for flexible electronics

Multilayer composite thin films for piezoelectric applications

Ultrathin ferroelectric thin films for applications in nanoelectromechanical systems

  • Microstructural studies

Quantitative texture analysis of ferroelectric thin films and oriented ceramics

Application of advanced methods of analysis of X-ray diffraction data. Combined method

Quantitative microscopy of bulk ceramics and thin films

Ferroelectric domain configurations

Microstructure-properties relationships

Scientific Publications

  • Co-author of more than 100 papers in scientific journals and 5 chapters of books
  • Associate Editor (2006-2010) Textures, Stress and Microstructure
  • Co-editor of the book: “Multifunctional Polycrystalline Ferroelectric Materials” (2011) Springer series in Materials Science vol. 140. Ed. L. Pardo, J. Ricote. (ISBN: 978-90-481-2874-7)
  • Invited editor: “Optical and X-ray metrology for advanced device materials characterization”, Thin Solid Films, 450 [1] (2004) Editors: D. Chateigner, M. Modreanu, M.E. Murtagh, J. Ricote, J. Schreiber (Elsevier)

Supervision of PhD Thesis