NanoCarma research group (ICMM-CSIC)
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← Laser writing of nanostructured silicon arrays for the SERS detection of biomolecules with inhibited oxidation
Growth of out-of-plane standing MoTe2(1−x)Se2x/MoSe2 composite flake films by sol-gel nucleation of MoOy and isothermal closed space telluro-selenization →

Fabrication and characterization of nanostructured porous silicon-silver composite layers by cyclic deposition: dip-coating vs spin-coating

Publicada el 26 enero, 2021 por agullo

N. Naveas, M. Manso-Silván, R. Pulido, F. Agulló-Rueda, V. Torres-Costa, T. Plaza, H. Pesenti, G. Recio, and J. Hernandez-Montelongo, “Fabrication and characterization of nanostructured porous silicon-silver composite layers by cyclic deposition: dip-coating vs spin-coating,“ Nanotechnol. 31, 365704 (2020)

Esta entrada ha sido publicada en microscopy, nanocharacterization, nanoscience, nanotechnology, Publications, Raman spectroscopy, silicon y etiquetada como coating, Raman spectroscopy, semiconductor, silicon. Guarda el enlace permanente.
← Laser writing of nanostructured silicon arrays for the SERS detection of biomolecules with inhibited oxidation
Growth of out-of-plane standing MoTe2(1−x)Se2x/MoSe2 composite flake films by sol-gel nucleation of MoOy and isothermal closed space telluro-selenization →
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