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Study of the formation mechanism of hierarchical silicon structures produced by sequential ion beam irradiation and anodic etching

Publicada el 23 diciembre, 2016 por icmmadmin

In a collaboration with the Autonomous University of Madrid (Department of Applied Physics and the Center for Micro Analysis of Materials) and the Institut für Solarenergieforschung Hameln (ISFH) of Germany we have studied the formation of micropatterns combining nanostructured (porous) … Sigue leyendo →

Publicado en HRTEM, ion irradiation, microscopy, nanocharacterization, nanoscience, nanotechnology, Raman spectroscopy, silicon | Etiquetado , , , , , , | Comentarios desactivados en Study of the formation mechanism of hierarchical silicon structures produced by sequential ion beam irradiation and anodic etching