Archivo de la categoría: HRTEM

New Order in (BiS)1.19(Bi1/3Cr2S4) Misfit Layer Compound

A. Gómez‐Herrero, A. R. Landa‐Cánovas and L. C. Otero‐Díaz, “New Order in (BiS)1.19(Bi1/3Cr2S4) Misfit Layer Compound,” Z. Anorg. Allg. Chem. 647, 1–7 (2021). In a sample with nominal composition BiCr2S5 a new misfit layer compound has been synthesized and studied … Sigue leyendo

Publicado en HRTEM, microscopy, nanocharacterization, Publications, Sin categoría | Etiquetado , | Comentarios desactivados en New Order in (BiS)1.19(Bi1/3Cr2S4) Misfit Layer Compound

Nanostructural changes upon substitutional Al doping in ZnO sputtered films

A. R. Landa-Cánovas, J. Santiso, F. Agulló-Rueda, P. Herrero, E. Navarrete-Astorga, E. Ochoa-Martínez, J. R. Ramos-Barrado, and M. Gabás, “Nanostructural changes upon substitutional Al doping in ZnO sputtered films,” Ceram. Int. 45, 6319–6327 (2019). Al:ZnO layers, with low and high … Sigue leyendo

Publicado en HRTEM, microscopy, nanocharacterization, nanoscience, Publications, Raman spectroscopy, transparent conductive oxides, zinc oxide | Etiquetado , , , , , , , , | Comentarios desactivados en Nanostructural changes upon substitutional Al doping in ZnO sputtered films

Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate

Work in collaboration with the Nanotech Unit, Department of Applied Physics I, University of Malaga, Spain. M. Gabás, E. Ochoa-Martínez, E. Navarrete-Astorga, A. R. Landa-Cánovas, P. Herrero, F. Agulló-Rueda, S. Palanco, J. J. Martínez-Serrano, and J. R. Ramos-Barrado, “Characterization of … Sigue leyendo

Publicado en HRTEM, microscopy, nanocharacterization, nanoscience, nanotechnology, Publications, transparent conductive oxides, zinc oxide | Etiquetado , , , , , , , | Comentarios desactivados en Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate

Study of the formation mechanism of hierarchical silicon structures produced by sequential ion beam irradiation and anodic etching

In a collaboration with the Autonomous University of Madrid (Department of Applied Physics and the Center for Micro Analysis of Materials) and the Institut für Solarenergieforschung Hameln (ISFH) of Germany we have studied the formation of micropatterns combining nanostructured (porous) … Sigue leyendo

Publicado en HRTEM, ion irradiation, microscopy, nanocharacterization, nanoscience, nanotechnology, Raman spectroscopy, silicon | Etiquetado , , , , , , | Comentarios desactivados en Study of the formation mechanism of hierarchical silicon structures produced by sequential ion beam irradiation and anodic etching

Laser heating induced phase changes of VO2

P. Vilanova-Martínez, J. Hernández-Velasco, A. R. Landa-Cánovas, and F. Agulló-Rueda, “Laser heating induced phase changes of VO2 crystals in air monitored by Raman spectroscopy,” J. Alloys Comp. 661, 122–125 (2016)

Publicado en HRTEM, Publications, Raman spectroscopy, Sin categoría | Etiquetado , , , , , , , | Deja un comentario

HRTEM microscopy of transformations in bulk amorphous silica produced by ultrafast laser direct writing

A transmission electron microscopy study of nanogratings formed in bulk amorphous silica by direct writing with an ultrafast pulsed laser with a radiation wavelength of 1030 nm and pulse duration of 560 fs is presented. The results achieved show that … Sigue leyendo

Publicado en HRTEM, microscopy, nanocharacterization, nanoscience, nanotechnology, Sin categoría | Etiquetado , , , , | Deja un comentario