Archivo de la etiqueta: SiO2

HRTEM microscopy of transformations in bulk amorphous silica produced by ultrafast laser direct writing

Publicada el 16 enero, 2015 por icmmadmin

A transmission electron microscopy study of nanogratings formed in bulk amorphous silica by direct writing with an ultrafast pulsed laser with a radiation wavelength of 1030 nm and pulse duration of 560 fs is presented. The results achieved show that … Sigue leyendo →

Publicado en HRTEM, microscopy, nanocharacterization, nanoscience, nanotechnology, Sin categoría | Etiquetado , , , , | Deja un comentario