Seminar announcement: A New Microscope in the Neighborhood by Angel Landa
During the last decade new advances in electron microscopy are producing a revolution in transmission electron microscopy. This new developments in Transmission Electron Microscopy (TEM) and scanning TEM (STEM) are pushing the boundaries of nanoscale imaging and analysis, offering enhanced capabilities for materials science, biology, and other fields. Here are some key trends and recent advancements:
New developments in Scanning Transmission Electron Microscopy (STEM) are pushing the boundaries of nanoscale imaging and analysis, offering enhanced capabilities for materials science, biology, and other fields. Here are some key trends and recent advancements:
Advancements in Hardware and Software
- Improved Resolution: Aberration-corrected STEMs are achieving sub-angstrom resolution, allowing researchers to visualize individual atoms and their arrangements with unprecedented clarity. The integration of Cold FEGs into new STEM instruments provides several key benefits that enhance their performance and capabilities: High Brightness and Small Energy Spread.
- Faster Imaging and Data Acquisition: New detector technologies and advanced data acquisition architectures enable faster and more sensitive imaging. This allows for the capture of dynamic processes and the acquisition of richer datasets in a shorter time.
- Enhanced Automation: Modern STEM platforms incorporate sophisticated automation features to streamline complex workflows, including alignment, calibration, and data acquisition. This improves ease of use and reduces the time required for experiments.
- Multi-Modal Analysis: Current STEM instruments often integrate multiple analytical techniques, such as Energy-Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS), allowing for simultaneous acquisition of structural, chemical, and electronic information at the nanoscale.
- Direct Electron Detectors (DEDs): These detectors, increasingly used in STEM, record movies of the sample rather than still images, allowing for the correction of beam-induced motion and resulting in higher resolution and improved signal-to-noise ratios.
In summary, the field of STEM is rapidly evolving with significant advancements in hardware, software, and methodologies. These new microscopes provide researchers with powerful tools to explore the nanoworld with unprecedented detail and enable breakthroughs in various scientific disciplines.